Technical Program of Test Forum 2012

Tuesday, November 27th, 2012
Time
Titles Speakers or additional info
8:30-9:00
Registration  
9:00-9:10
Welcome/Introduction Knut Båtstoløkken
9:10-10:00
Key Note Session Chairman: Knut Båtstoløkken
9:10-10:00
Data Mining in Test – the Source to Wisdom and Prosperity? Stig Lumbye, DELTA
10:00-10:20
Exhibitor Forum, short presentations Chairman: Bengt Magnhagen
10:20-10:50
Coffee Break / Exhibition  
10:50-12:20
Session1: Functional Testing 1 Chairman:Stig-Gunner Jensen
10:50-11:20
How to select a test platform among the several different options like PXI, LXI and AXI Alexander Frew, Agilent
11:20-11:50
High Density Switch Selection for Maximum Reliability & Performance Shaun Fuller, Pickering
11:50-12:20
Building a complete reliable Test solution using autonomous subsystems (modules) lead to great Engineering benefits Peter van Oostrom, 6TL Engineering
12:20-13:30
Lunch  
13:30-15:00
Session 2: Structural Testing Chairman: Mick Austin
13:30-14:00
Just-enough, Best test coverage Jonathan O’Connell, Agilent
14:00-14:30
Flying Probe Multi-Probe System for Functional Test and Design Validation Marco Barahmand, Acculogic
14:30-15:00
Embedded Instrumentation for Test Quality Improvement Artur Jutman, TU Tallinn
15:00-15:30
Coffee Break / Exhibition  
15:30-16:00
Session 3: Functional Testing 2 Chairman: Stig-Gunner Jensen
16:00-16:30
FLEXSTAND OI - a simple way to create an Operator Interface Anders Meister, CIM Systems
16:30-17:00
News from Conferences  
17:00-17:30
Fruits & Refreshments / Exhibition  
17:30-19:00
Panel debate:
“Where is test of electronics heading?”
Panel moderator: Birger Schneider
20:00
Dinner  
22:00
Social get-together in the Bar  



Wednesday, November 28th, 2012
Time
Titles Speakers or additional info
9:00-10:30
Session 4: Boundary Scan & IJTAG Chairman: Artur Jutman
9:00-10:00
Invited Speaker, Tutorial

An Update on IEEE Boundary-Scan Based Standards: 1149.1, 1149.8.1, P1687, P1838

Bill Eklow, Cisco, USA
10:00-10:30
JTAG based Board Level Testing - How to make it work Jan Heiber, Göpel
10:30-11:00
Coffee Break / Exhibition  
11:00-12:30
Session 5: RF Testing Chairman: Birger Schneider
11:00-11:30
Time Meets Frequency Kenneth Rasmussen, Rohde & Schwarz
11:30-12:00
REVERB Stress EMC Test to Detect Possible Field Failures Anders Mynster, DELTA
12:00-12:30
Merging high-performance instruments and FPGAs for meeting hard RF test challenges Remco Krul, National Instruments
12:30-13:30
Lunch  
13:30-15:00
Session 6: Miscellaneous Testing Chairman: Knut Båtstoløkken
13:30-14:00
Halt/HASS Testing – Weeding Out Design Errors through Accelerated Testing Suzanne Otto, DELTA
14:00-14:30
A BIST strategy for a NoC switch Controller Described Kim Petersén, HDC
14:30-15:00
From Electro Acoustic Testing over Perceptual Testing to the World of Affective Measurements Birger Schneider, DELTA
15:00-15:15
Closing Session: concluding remarks Knut Båtstoløkken




Exhibition

As usually, a mini exhibition will take place in frames of Test Forum event where vendors are welcome to present their tools and methodologies related to production test. Exhibitors can make arrangements with NTF about exhibition space. If nothing special has been agreed, a table of about 60x120 cm2, as well as space for posters or similar material will be provided. Every exhibitor will be given 7-8-minute slot in the program for a brief introduction.

Poster Sessions

As a new activity, we this year institute a Poster Session. It consists of a poster board for each poster presentation, approximately 1,5 m wide x 0,75 m high. The intention is that presenters can put copies of their main slides up on the poster board wall right after a session ends. That will enable attendees and presenters to get into a more detailed discussion on specific issues of the presentation that may otherwise not be handled in the short Q&A interval after each presentation. Each presenter will have a poster board available. After the break, the poster boards need to be cleared to make room for poster for the following session.
The poster material itself can be as simple as simple A4 copies of essential slides, and possibly some additional info, and/or it can be more advanced printouts supporting the views of the previous presentation.
We hope that the poster session will contribute further to the exchange of concepts and ideas and lead to fruitful discussions, hence stimulate the general transfer of knowledge.

Nordic Test Forum (NTF) Annual Assembly, November 26th 2012

The NTF organization was established in 2001. Since then, it holds an annual general assembly a day before the Test Forum conference. This year it will be held on November 26th at 20:30. The agenda and motions will be dispatched to the members in a separate mailing.

If you do not intend to participate in the Annual Assembly, the Test Forum 2012 starts with registration on November 27th from 8:30 to 9:00.