Design for Testability – NTF Webinar

March 23, 2021, 13:00 - 14:30 CET

Download PDF booklet here! Updated 2021.03.08.

Nordic Test Forum is a major annual event in the Nordics focusing on issues relevant to managers, engineers and technicians working in the fields of production, test, inspection and validation of electronics. Adapting to travel restrictions, in 2021, Nordic Test Forum has decided to arrange a series of FREE on-line webinars. The focus will be on industrial challenges that many seek solutions for, so here is your chance to stay updated on the latest developments – free of charge!

Program

13:00 Design for Testability – Best practices for integrating test into your design

Toni Ahrnt Bojsen, DSE Test Solutions, Denmark

Many test engineers are struggling with long test times and poor test yield because a device under test is not designed well for test. In this session, we focus on design for testability of PCBAs (functional test), ‘End of Line test’ and why it is important to include test requirements within the embedded software of the device under test. The presentation is backed by many years of experience in developing production test systems. Practical guidelines, design hints and example layouts for PCBAs are provided.

13:30 Design for Test (DfT) beyond Boundary Scan

Jan Heiber, Göpel electronic, Germany

Comprehensive testing requires special design preparations on today's assemblies. Because typically a single type of test cannot meet all quality requirements, one needs tools for cross-test analysis and reporting - multi-dimensional DfT analysis and test coverage reports. The presentation shows different embedded test options and covers test preparation, rounded up by example analyses and reports.

14:00 What is the today expectations on DfT? - It depends on where you come from and where you want to go

Christophe Lotz, Aster Technology, France

Traditional DfT involves tedious and time consuming manual analysis that requires pro-active and tight cooperation between Electronic Designer, E-CAD Designer and Test Engineers. Today, Industry 4.0 is driving DfT technology in the direction of using Digital Twins to provide the digital continuity linking product design and manufacturing. The digital twin allows combination of inspection and test processes for simulating “what-if scenarios” as well as automating analysis reports that can be shared instantly between designers and test engineers for continuous feedback and updates.

14:30 Wrap up

 

Format of the event

  • 1.5h webinar held on Zoom platform.
  • 25 minutes of presentation and 5 minutes for questions/comments.
Target Audience

Engineers and technicians, managers and planners within the fields of electronics production and test, inspection and validation. Includes also decision makers in organizations that procure equipment, tools and systems for production and test, inspection and validation of electronics.

Participation Cost
  • Free of charge
Nordic Test Forum aims at
  • Creating and sustaining a relevant, balanced and coherent interaction between users as well as between users and suppliers of solutions for test, inspection, validation and production of electronics.
  • Providing an up-to-date view on new methodologies and tools for relevant test, inspection, validation and production of electronics.
  • Establishing a relevant and balanced view on equipment, systems, tools and software from tool vendors in the domain.
First, register here:

https://testforum.nemtilmeld.dk/

Then, join the Zoom Meeting

https://us02web.zoom.us/j/82460189763?pwd=cWVrNVZjV0ZqcXJ2M0JFREVvbEtrd…

Meeting ID: 824 6018 9763
Passcode: 121170

Technical contact

Birger Schneider 
Tel: +45 4055 2100
Email: birger.schneider@chamaj.com