Technical Program of Test Forum 2010
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Tuesday, November 23rd, 2010
|
Time
|
Titles | Speakers or additional info |
|
9:00-9:30
|
Registration | |
|
9:30-9:40
|
Welcome/Introduction | Knut Båtstoløkken |
|
9:40-10:40
|
Key Note Session | Chairman: Knut Båtstoløkken |
|
9:40-10:40
|
The Real Cost of Not Testing! | Michael Smith, Consultant |
|
10:40-11:20
|
Exhibitor presentation | Chairman: Jürgen Sedlacek |
|
11:20-11:50
|
Coffee Break / Exhibition | |
|
11:50-12:50
|
Session 1: Boundary Scan 1 | Chairman: Bengt Magnhagen |
|
11:50-12:20
|
IEEE 1149.7, 1149.8.1, 1149.1-2010, 1687 update: a tutorial | Artur Jutman, Testonica Lab/ TU Tallinn |
|
12:20-12:50
|
Test scheduling on IJTAG | Erik Larsson, TU Linköping |
|
12:50-13:50
|
Lunch | |
|
13:50-15:20
|
Session 2: Functional Test | Chairman: Birger Schneider |
|
13:50-14:20
|
BIRST Support of LXI & PXI Matrices | Shaun Fuller, Pickering |
|
14:20-14:50
|
True flexible and modular test systems saves engineers time and money. | Peter van Oostrom, 6TL |
|
14:50-15:20
|
New test applications enabled by FPGA technology | Vidar Grønås, NI |
|
15:20-15:50
|
Coffee Break / Exhibition | |
|
15:50-16:50
|
Session 3: Functional Test continued | Chairman: Artur Jutman |
|
15:50-16:20
|
Modular solutions for the future | Bjørn Birkeland, 4Test |
|
16:20-16:50
|
News from Conferences | Chairman: Artur Jutman |
|
16:50-17:15
|
Fruit & Refreshments / Exhibition | |
|
17:15-19:00
|
Panel debate: The future of PXIe, LXI and AXI - shine or decline? | Panel moderator: Birger Schneider |
|
20:00
|
Dinner at FIRST Hotel Ambassadeur | |
|
22:30
|
Social get-together in the Bar at First Hotel Ambassadeur | |
Wednesday, November 24th, 2010
|
Time
|
Titles | Speakers or additional info |
|
9:00-10:30
|
Session 4: Functional test 2 | Chairman: Mick Austin |
|
9:00-9:30
|
The Challenges in 3D Video Testing | Birger Schneider, NI Engineering |
|
9:30-10:00
|
In System Characterization and Test Using On-Chip Capture Control to Generate Failing Frequency Signatures | Bill Eklow, Cisco |
|
10:00-10:30
|
A coverage tool to explore the question "What does it mean when the board test passes?" |
Lars Kongsted Jensen, EP-TeQ |
|
10:30-11:00
|
Coffee Break / Exhibition | |
|
11:00-12:30
|
Session 5: Boundary Scan 2 | Chairman: Bjørn B. Larsen |
|
11:00-11:30
|
Boundary scan test of special boards | Roger Hagebakken, Hapro |
|
11:30-12:00
|
Advanced flash programming by processor assisted methods | Jan Heiber, Goepel electronic GmbH |
|
12:00-12:30
|
Case study of test solution based on functional test combined with boundary-scan testing | Mick Austin, JTAG |
|
12:30-13:30
|
Lunch | |
|
13:30-15:00
|
Session 6: Test Strategies | Chairman: Stig-Gunnar Jensen |
|
13:30-13:50
|
Test development at Kitron | Karl-Berge Rød, Kitron |
|
13:50-14:20
|
ATML: Definitions and practice | Andres Mellik, Juku Lab/TU Tallinn, Øystein Fallo, Virinco Tom Lomsdalen, Virinco |
|
14:20-14:35
|
INEMI: Test Inspection Measurement. TWG Status Report | Michael Smith, Consultant |
|
14:35-15:00
|
Understanding DFT Methodologies | Michael Smith, Consultant |
|
15:00-15:10
|
Closing Session: concluding remarks | Knut Båtstoløkken |
Dinner and Social Get-Together
At 20:00, November 23rd we will enjoy a dinner in the hotel restaurant.
Exhibition
As usually, a mini exhibition will take place in frames of Test Forum event where vendors are welcome to present their tools and methodologies related to production test. Exhibitors can make arrangements with NTF about exhibition space. If nothing special has been agreed, a table of about 60x120 cm2 , as well as space for posters or similar material will be provided. Every exhibitor will be given 7-8-minute slot in the program for a brief introduction.