Technical Program of Test Forum 2017
Updated 2017.11.19.
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Tuesday, November 28th, 2017 |
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Time
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Titles
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Speakers or additional info
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08:30-08:50
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Registration
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08:50-09:00
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Welcome / Introduction
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Knut Båtstoløkken
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09:00-10:00
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Key Note Session
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Chairman: Knut Båtstoløkken
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09:00-10:00
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20 Billion Connected Devices, How to Test them All – or Not to Test at All?
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Jaakko Ala-Paavola, Etteplan
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10:00-10:30
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Exhibitor Forum: short presentations
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Chairman: Stig-Gunnar Jensen
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10:30-11:00
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Coffee Break / Exhibition
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11:00-12:30
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Session 1: Test Strategies 1
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Chairman: Erik Larsson
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11:00-11:30
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Could be the Flying Probe an alternative to the Board Tester System?
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Lothar Diez, SPEA
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11:30-12:00
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In-Circuit test vs functional test
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Hans Baka, DigitalTest
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12:00-12:30
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The Odds of Test and Measurement
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Hans Manhaeve, Ridgetop Europe
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12:30-13:30
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Lunch
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13:30-15:00
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Session 2: Test system design
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Chairman: Bjørn B. Larsen
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13:30-14:00
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A short introduction to Lean concepts
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Mikko Karjalainen, KaVo Kerr Group
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14:00-14:30
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Lean tools in production test development
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Tomi Pietari, Vaisala
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14:30-15:00
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To Platform or Not to Platform - aspects of designing test systems
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Mattias Ericsson, AddQ
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15:00-15:30
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Coffee Break / Exhibition
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15:30-16:30
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Session 3: Test Strategies 2
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Chairman: Mauri Aalto
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15:30-16:00
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Point Solutions or Plant-based MES and Beyond?
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Mark Laing, Siemens (Valor)
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16:00-16:30
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Are traditional SPC tools the right choice for finding quality issues in electronics manufacturing?
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Tom Andres Lomsdalen, Virinco
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16:30-17:00
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News from conferences
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Chairman: Artur Jutman
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17:00-17:30
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Fruit & Refreshments / Exhibition
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17:30-19:00
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Panel debate “Internet of Things (IoT)serving the test Community – and how do we test IoT?”
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Panel moderator: Birger Schneider
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19:30
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Dinner
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Wednesday, November 29th, 2017 |
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Time
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Titles
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Speakers or additional info
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09:00-10:30
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Session 4: Fixturing & test interfaces
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Chairman: Raimedas Sodaitis
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09:00-09:30
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Eliminating Cables from PXI ATE systems
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Gary Clayton, MAC-Panel
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09:30-10:00
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Latest Mass Interconnect Solutions - i.e. High Speed, High Power, EMI solutions...
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Werner S. Pinter, Virginia Panel Corporation
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10:00-10:30
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Best practices in functional testing, Case study with SKS Automation Oy
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Vesa Koski, Etteplan
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10:30-11:00
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Coffee Break / Exhibition
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11:00-12:30
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Session 5: Functional Test
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Chairman: Lars Kongsted-Jensen
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11:00-11:30
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Box-builds in production testing and outlook for future
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Jani Angervuo, Kone
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11:30-12:00
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Unified EoL test and programming over automotive bus
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Jan Heiber, Göpel
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12:00-12:30
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Improving Testability During PCB Design
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Mark Laing, Siemens (Valor)
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12:30-13:30
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Lunch
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13:30-15:00
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Session 6: JTAG Based Test
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Chairman: Artur Jutman
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13:30-14:00
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Eliminating or minimising Embedded Software Tests.
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Mick Austin, JTAG Technologies / Jussi Mustola, Etteplan
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14:00-14:30
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SiliconInsight / IJTAG
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Martin Keim, Mentor
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14:30-15:00
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Boundary Scan Design Review for Better Test Strategy
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Jun Balangue, Keysight
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15:00-15:10
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Closing Session: TestForum concluding remarks
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Knut Båtstoløkken Kitron
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15:10-15:30
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Coffee Break / Exhibition
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15:30-17:00
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Session 7: Functional test revisited
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Chairman: Mick Austin
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15:30-16:00
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Electronic drivers for LEDS - why are many failing
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Birger Schneider, Delta
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16:00-16:30
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Would Functional Tests Detect All Timing Issues On a Board?
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R. Cantoro, E. Sanchez, M. Sonza Reorda, Politecnico di Torino, A. Jutman, Testonica Lab
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16:30-17:00
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TR5001S2 Parallel Test
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Tamás Szabó, Equip-Test
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Exhibition
As usually, a mini exhibition will take place in frames of TestForum event where vendors are welcome to present their tools and methodologies related to production test. Exhibitors can make arrangements with NTF about exhibition space. If nothing special has been agreed, a table of about 60x120 cm2, as well as space for posters or similar material will be provided. Every exhibitor will be given 7-8-minute slot in the program for a brief introduction.
Dinner
The conference dinner on November 28th will be held at the conference hotel. After the dinner, all participants are invited back to the bar.
Nordic Test Forum (NTF) Annual Assembly, November 27th 2017
The NTF organization was established in 2001. Since then, it holds an annual general assembly a day before the Test Forum conference. This year it will be held on November 27th at 20:00. The agenda and motions has been dispatched to the members in a separate mailing.
If you do not intend to participate in the Annual Assembly, the Test Forum 2017 starts with registration on November 28th from 8:30 to 8:50.