Technical Program of Test Forum 2018
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Tuesday, November 27th, 2018
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Time
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Titles
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Speakers or additional info
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08:30-08:50
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Registration
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08:50-09:00
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Welcome / Introduction
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Knut Båtstoløkken
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09:00-10:00
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Key Note Session
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Chairman: Knut Båtstoløkken
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09:00-10:00
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Trends in the use of robotics in the electronic production and test of devices
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Søren Peter Johansen, Danish Technological Institute, Denmark
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10:00-10:30
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Exhibitor Forum: short presentations
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Chairman: Mick Austin
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10:30-11:00
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Coffee Break / Exhibition
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11:00-12:30
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Session 1: Test Strategies 1
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Chairman: Stig-Gunnar Jensen
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11:00-11:30
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In-line PCBA testing
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Henrik Frost, Danfoss
Peder D. Lomborg, DSE |
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11:30-12:00
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PCB Design for Test and Implementation of Test Strategies
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Mark Laing, Mentor, A Siemens Business
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12:00-12:30
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Defect free-products: what is the best DfT flow in order to deliver defect-free PCBA
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Christophe Lotz, Aster
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12:30-13:30
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Lunch
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13:30-15:00
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Session 2: Structural Test
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Chairman: Mattias Ericsson
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13:30-14:00
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How to test Power Electronics?
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Lothar Diez, Spea
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14:00-14:30
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Increasing ICT coverage with Powered Frame-scan and protect your devices with Safe Test
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Peter Kuhlemann, Teradyne
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14:30-15:00
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The Next Generation of Manufacturing Board Test: Testing the technologies of the future
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Jun Balangue, Keysight Technologies
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15:00-15:30
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Coffee Break / Exhibition
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15:30-16:30
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Session 3: Cobots in Test Automation
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Chairman: Magnus Rönqvist
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15:30-16:00
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The Automation challenge - The Usage of Collaborative Robots in Testing and In-Circuit Tests
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Thomas Goetz, Keysight Technologies
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16:00-16:30
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Flexible automation supported using Cobots (Collaborative robots)
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Per Kloster Poulsen, Universal Robots
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16:30-17:00
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News from conferences
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Chairman: Artur Jutman
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17:00-17:30
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Fruit & Refreshments / Exhibition
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17:30-19:00
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Panel debate:
Robotics in testing vs traditional automation? |
Panel moderator: Birger Schneider
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19:30
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Dinner
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Wednesday, November 28th, 2018
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Time
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Titles
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Speakers or additional info
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09:00-10:30
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Session 4: Test Strategies 2
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Chairman: Paulius Musteikis
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09:00-09:30
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To Software Platform or Not to Software Platform
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Mattias Ericsson, AddQ
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09:30-10:00
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Embedded Functional Test and Measurement
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Artur Jutman, Testonica Lab
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10:00-10:30
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A Soft Approach to Manufacturing Execution Systems
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Vidar Grønås, Virinco
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10:30-11:00
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Coffee Break / Exhibition
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11:00-12:30
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Session 5: Reliability, RF & Other Challenges
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Chairman: Mikko Karjalainen
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11:00-11:30
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Reliable product development based on physics of failure
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Suzanne Otto, FORCE Technology
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11:30-12:00
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Reliable Electronics? Precise Current Measurements May Tell You Otherwise…
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Hans Manhave, Ridgetop
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12:00-12:30
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Production PCBa RF testing @ Cobham Satcom
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Torben Krogsgaard, Cobham Satcom
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12:30-13:30
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Lunch
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13:30-15:00
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Session 6: JTAG Based Test & Interconnects
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Chairman: Lars Kongsted-Jensen
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13:30-14:00
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Synthetic Instruments for design validation and production test
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Heiko Ehrenberg/Jan Heiber, GÖPEL Electronics
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14:00-14:30
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Concurrent IJTAG a next Step in IJTAG-based Test
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Rene Krenz-Baath, Hochschule Hamm-Lippstadt
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14:30-15:00
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New Innovative and Modular Mass Interconnect Solution with Electromechanical Locking ODU-MAC® Black-Line
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Markus Rochau, ODU
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15:00-15:10
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Closing Session: TestForum concluding remarks
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Knut Båtstoløkken Kitron
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15:10-15:20
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Break
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15:20-18:25
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Workshop on HI2OT: “Nordic University Hub on Industrial Internet of Things”
Program details to follow |
Chairman: Erik Larsson
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Wine & cheese served at a convenient time during the IoT workshop
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Exhibition
As usually, a mini exhibition will take place in frames of TestForum event where vendors are welcome to present their tools and methodologies related to production test. Exhibitors can make arrangements with NTF about exhibition space. If nothing special has been agreed, a table of about 60x120 cm2, as well as space for posters or similar material will be provided. Every exhibitor will be given 7-8-minute slot in the program for a brief introduction.
Dinner
The conference dinner on November 27th will be held at the conference hotel. After the dinner, all participants are invited back to the bar.
Nordic Test Forum (NTF) Annual Assembly, November 26th 2018
The NTF organization was established in 2001. Since then, it holds an annual general assembly a day before the Test Forum conference. This year it will be held on November 26th at 20:00. The agenda and motions has been dispatched to the members in a separate mailing.
If you do not intend to participate in the Annual Assembly, the Test Forum 2018 starts with registration on November 27th from 8:30 to 8:50.