Technical Program of Test Forum 2016 v2.3
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Tuesday, November 29th, 2016 |
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Time
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Titles
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Speakers or additional info
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08:30-08:50
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Registration
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08:50-09:00
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Welcome / Introduction
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Knut Båtstoløkken
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09:00-10:00
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Key Note Session
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Chairman: Knut Båtstoløkken
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09:00-10:00
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Innovative products developed in Lithuania
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Vytautas Jokužis, UAB Elinta
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10:00-10:30
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Exhibitor Forum: short presentations
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Chairman: Mick Austin
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10:30-11:00
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Coffee Break / Exhibition
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11:00-12:30
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Session 1: Structural test and test data
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Chairman: Birger Schneider
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11:00-11:30
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Advanced SPI technology
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Mr. Jang Woong, PARMI
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11:30-12:00
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Can board tester satisfy all the needs?
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Lothar Diez, SPEA
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12:00-12:30
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Having the right data & information at the right time: Utopia or Reality?
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Ignace Braem, Siemens Industry Software
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12:30-13:30
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Lunch
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13:30-15:00
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Session 2: Test Strategies and Test Quality 1
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Chairman: Stig-Gunnar Jensen
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13:30-14:00
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Complete Integration of Test and Inspection Machines for PCB Manufacturing
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Mark Laing, Valor
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14:00-14:30
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Test Coverage 4.0: How to build a consistent design to test flow in order to deliver defect-free PCBA
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Christophe Lotz, Aster Technologies
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14:30-15:00
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Screening out marginal defects and outliers passing functional test
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Artur Jutman, Sergei Odintsov, Testonica Lab
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15:00-15:30
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Coffee Break / Exhibition
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15:30-16:30
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Session 3: Test automation, Robotics for test engineering
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Chairman: Bjørn B. Larsen
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15:30-16:00
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Automation of test: what's solutions, and how to implement it
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Jacques Bonnement, Teradyne
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16:00-16:30
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In-line functional testing
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Raimedas Sodaitis, UAB Kitron
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16:30-17:00
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News from conferences
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Chairman: Artur Jutman
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17:00-17:30
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Fruit & Refreshments / Exhibition
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17:30-19:00
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Panel debate: "Can automation take us to new levels in test quality and efficiency"
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Panel moderator: Birger Schneider
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19:30
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Dinner
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Wednesday, November 30th, 2016 |
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Time
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Titles
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Speakers or additional info
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9:30-11:00
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Session 4: Functional test and failure analysis
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Chairman: Stig-Gunnar Jensen
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9:30-10:00
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PXI Digital Pattern Instrument
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Armen Hakobyan, National Instruments
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10:00-10:30
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Easy tools for detecting pre- and post-failure parameters for corrosion analysis on printed circuit board assemblies
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Vadimas Verdingovas, EC-RAT ApS
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10:30-11:00
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Production test considerations at small to medium volume factory. What do customers want?
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Rolf Østvik, AXXE
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11:00-11:30
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Coffee Break / Exhibition
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11:30-13:00
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Session 5: JTAG based test
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Chairman: Lars Kongsted-Jensen
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11:30-12:00
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Advanced testing of prototypes and manufacturing with JTAG Embedded Diagnostic OS
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Jan Heiber, Göpel
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12:00-12:30
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Using JTAG Functional Test in LabView to Test microprocessor or FPGA peripheral devices
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Mick Austin, JTAG Technologies
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12:30-13:00
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IEEE1149.1 TAP accessible embedded test solutions to tackle challenges in production testing
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Mika Pussinen, Nokia Networks, Oulu
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13:00-14:00
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Lunch
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14:00-14:50
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Session 6: Test Strategies and Test Quality 2
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Chairman: Raimedas Sodaitis
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14:00-14:30
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Mining the Test Data Motherlode
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Ari Pihlajavesi, Predisys
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14:30-14:50
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How to accelerate vibration test via Fatigue Damage Spectrum
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Pavel Fišer, Vibration Research
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14:50-15:00
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Closing Session: TestForum concluding remarks
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Knut Båtstoløkken Kitron
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Exhibition
As usually, a mini exhibition will take place in frames of TestForum event where vendors are welcome to present their tools and methodologies related to production test. Exhibitors can make arrangements with NTF about exhibition space. If nothing special has been agreed, a table of about 60x120 cm2, as well as space for posters or similar material will be provided. Every exhibitor will be given 7-8-minute slot in the program for a brief introduction.
Dinner
The conference dinner on November 29th will be held at the conference hotel. After the dinner, all participants are invited back to the bar.
Nordic Test Forum (NTF) Annual Assembly, November 28th 2016
The NTF organization was established in 2001. Since then, it holds an annual general assembly a day before the Test Forum conference. This year it will be held on November 28th at 20:00. The agenda and motions has been dispatched to the members in a separate mailing.
If you do not intend to participate in the Annual Assembly, the Test Forum 2016 starts with registration on November 28th from 8:30 to 8:50.