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Time
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Titles
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Speakers or additional info
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8:30-9:00
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Registration
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9:00-9:10
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Welcome/Introduction
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Artur Jutman
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9:10-10:10
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Key Note Session
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Chairman: Knut Båtstoløkken
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9:10-10:10
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How to tie chip, board and system test together into a single, "seamless" test process?
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Bill Eklow, Cisco Systems
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10:10-10:40
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Coffee Break / Exhibition
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10:40-12:00
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Session 1: Invited speaker / Exhibitors
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Chairman: Bengt Magnhagen
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10:40-11:20
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Delay Testing - From the Ivory Tower to Tools in the Workshop
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Einar J. Aas, Norwegian Univ. of Science and Technology
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11:20-12:00
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Exhibitor presentations
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All Exhibitors
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12:00-12:30
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Exhibition |
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12:30-13:30
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Lunch |
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13:30-15:00
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Session 2: Functional test
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Chairman: Stig-Gunnar Jensen |
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13:30-14:00
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RF testing by a Software-Defined Test Platform for Current and Future Communications Systems
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National Instruments
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14:00-14:30
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Digital Audio Measurements Through Efficient FPGA Based Test Techniques
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Birger Schneider, microLEX
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14:30-15:00
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Eliminate Test
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Bernard Sutton, Lighthouse Creativity
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15:00-15:30
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Coffee Break / Exhibition
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15:30-17:00
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Session 3: Structural test
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Chairman: Mick Austin
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15:30-16:00
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Fault Modeling and Fault Diagnosis in Digital Systems
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Raimund Ubar, Tallinn Univ. of Technology
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16:00-16:30
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Reverse Engineering for Board Test
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Luca Corli, SEICA
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16:30-17:00
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Integrating Boundary Scan and Analog Opens techniques
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Mike Smith, Teradyne
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17:00-17:20
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Fruits & Refreshments / Exhibition
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|
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17:20-17:40
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News from Conferences
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Birger Schneider
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17:40-19:00
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Panel debate: “Will structural test finally wipe out the needs for functional test”
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Panel moderator: Birger Schneider
Panelists: Mike Smith, Bernard Sutton, David Owen, Knut Båtstoløkken, Stig-Gunnar Jensen
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20:00
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Dinner in Olde Hansa
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22:30
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Social get-together in Nordic Hotel Forum
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Wednesday, November 26th, 2008
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Time
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Titles
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Speakers or additional info
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8:30-10:00
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Session 4: System Test & Quality Management
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Chairman: Bengt Magnhagen
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8:30-9:00
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PostgreSQL: The world's most advanced
open source database
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Rolf Østvik, AXXE AS
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9:00-9:30
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Magellon Quality Lifecycle Management
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Paul Attwell, CIMTEK
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9:30-10:00
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SJTAG Backgrounder
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Ian M. McIntosh, SELEX Sensors and Airborne Systems
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10:00-10:30
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Coffee Break / Exhibition
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|
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10:30-12:00
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Session 5: Boundary Scan
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Chairman: Artur Jutman
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10:30-11:00
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Boundary Scan and Emulation - Complement or Contradiction?
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Jan Heiber, GOEPEL Electronic
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11:00-11:30
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Board testing of VDSL2 DSLAM using Boundary Scan
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Magnus Björk, Elcoteq Tallinn
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11:30-12:00
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GEB techniques to fast BScan test Fixture devel-opment and manufacturing
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Francesca Gabbani, GEB-GROUP
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12:00-13:00
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Lunch
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|
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13:00-14:30
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Session 6: LXI
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Chairman: Birger Schneider
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13:00-13:30
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LXI Standard Evolution
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David Owen, Pickering Interfaces, LXI consortium
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13:30-14:00
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Comparing LXI and Modular Platforms for Imple-mentation of High Density switching functions.
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David Owen, Pickering Interfaces
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14:00-14:30
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Modular Mass Interconnect Solutions for LXI
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Gary Clayton, MAC-Panel
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14:30-15:00
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Coffee Break / Exhibition
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|
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15:00-16:30
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Session 7: Instrumentation
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Chairman: Mick Austin
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15:00-15:30
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Synthetic Instruments – an overview
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Niclas Björsell, Gävle Universty
Musab Siddiq, Hapro
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15:30-16:00
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RFID – a tool in logistics. Deployment test.
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Martin Viktil, SINTEF
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16:00-16:30
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Advanced X-ray inspection: µAXI and nanofocus Computed Tomography
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Dr. André Egbert, Phoenix|x-ray Systems + Services GmbH
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16:30-16:40
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Closing Session: concluding remarks
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Knut Båtstoløkken
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