Technical Program of Test Forum 2009
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Tuesday, December 1st, 2009
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Time
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Titles | Speakers or additional info |
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9:00-9:30
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Registration | |
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9:30-9:40
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Welcome/Introduction | Artur Jutman |
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9:40-10:40
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Key Note Session | Chairman: Knut Båtstoløkken |
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9:40-10:40
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Is There Any Innovation Left in Test? | Bill Eklow, Cisco Systems |
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10:40-11:00
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Exhibitor presentations | Chairman: Jürgen Sedlacek |
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11:00-11:30
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Coffee Break / Exhibition | |
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11:30-13:00
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Session 1: Structural Test | Chairman: Mick Austin |
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11:30-12:00
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Probe design and material selection for optimal lead free board testing | Bruce Valentine, IDI |
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12:00-12:30
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Using Wave Form To Test For Opens On Component Packages | Michael Smith, Consultant |
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12:30-13:00
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Testing High-Density Electro-Optical Backplane | Knut Båtstoløkken, Kitron |
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13:00-14:00
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Lunch | |
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14:00-15:30
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Session 2: Structural/Functional Test | Chairman: Birger Schneider |
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14:00-14:30
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Laser Height Measurement Monitoring Solder and Placement of BGA, uBGA and Flip Chips | Michael Smith, Consultant |
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14:30-15:00
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Hardware In the Loop (HIL) testing is mainly used in Aerospace and Automotive but is suitable to use for many other embedded products | Hans Nyström, Prevas |
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15:00-15:30
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Functional Test Developing Under The Economic Crises without reducing testability | Stig-Gunnar Jensen, Flextronics |
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15:30-16:00
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Coffee Break / Exhibition | |
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16:00-17:00
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Session 3: Various Test Techniques 1 | Chairman: Artur Jutman |
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16:00-16:30
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The Benefits of FPGA-Enabled Instruments In RF and Communications Test | Johan Olsson, NI |
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16:30-17:00
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News from Conferences | Chairman: Artur Jutman |
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17:00-17:25
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Fruits & Refreshments / Exhibition | |
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17:25-19:00
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Panel debate: “Will Test survive the economic crises and can we afford quality variations” | Panel moderator: Birger Schneider |
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20:00
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Dinner at Scandic Infra City Hotel | |
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22:30
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Social get-together in the Bar at Scandic Infra City | |
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Wednesday, December 2nd, 2009 |
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Time
|
Titles | Speakers or additional info |
|
9:00-9:30
|
Invited Speaker | Chairman: Knut Båtstoløkken |
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9:00-9:30
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From Technology Trends To Requirements – New Views About Instruments | Jyrki Sippola, NOKIA |
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9:30-10:30
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Session 4: Boundary Scan 1 | Chairman: Stig-Gunnar Jensen |
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9:30-10:00
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BS2VHDL and Other Embedded Techniques for BS Test Acceleration | Artur Jutman, Tallinn University of Technology |
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10:00-10:30
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Deployment of JTAG Based HW Self-Test in a Radio Base Station | Thomas Kronqvist, SAAB |
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10:30-11:00
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Coffee Break / Exhibition | |
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11:00-12:30
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Session 5: Boundary Scan 2 | Chairman: Bjørn B. Larsen |
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11:00-11:30
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RAM testing with Boundary Scan - Structural Test or Functional Test? | Jan Heiber, GOEPEL Electronic |
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11:30-12:00
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Using Configurable Logic And Boundary Scan To Test Advanced Board Interface Protocols | Anthony Sparks, JTAG Technologies |
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12:00-12:30
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Non-Intrusive Board Test Strategies For The Intel Xeon Processor 5500 Series | Kent Zetterberg, ASSET InterTech Inc |
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12:30-13:30
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Lunch | |
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13:30-15:00
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Session 6: Various Test Techniques 2 | Chairman: Bengt Magnhagen |
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13:30-14:00
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An (Almost) C-Testable Strategy For NoCs | Kim Petersén, HDC |
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14:00-14:30
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How To Optimize Your PXI Functional Test System combined JTAG Boundary Scan Technology | Victor Fernandes, Geotest MTS |
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14:30-15:00
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Acoustical Noise Problems in Production Test of Elektroacoustical Units and Electronic Cabinets | Birger Schneider, NI |
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15:00-15:15
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Closing Session: concluding remarks | Knut Båtstoløkken |
Dinner and Social Get-Together
At 20:00 we will enjoy a dinner sourounded by a tropical environment enclosed by palm treas and a pond.
Exhibition
As usually, a mini exhibition will take place in frames of Test Forum event where vendors are welcome to present their tools and methodologies related to production test. Exhibitors can make arrangements with NTF about exhibition space. If nothing special has been agreed, a table of about 60x120 cm2, as well as space for posters or similar material will be provided. Every exhibitor will be given a 7-8-minute slot in the program for a brief introduction.
NTF Annual General Assembly
This year's NTF AGM will take place on November 30th, at 19:30. The participation is open for all members. No registration is necessary.
If you do not intend to participate in the Annual Assembly, the TestForum 2009 starts with Registration on December 1st, at 9:00.