Technical Program of Test Forum 2009

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Tuesday, December 1st, 2009
Time
Titles Speakers or additional info
9:00-9:30
Registration  
9:30-9:40
Welcome/Introduction Artur Jutman
9:40-10:40
Key Note Session Chairman: Knut Båtstoløkken
9:40-10:40
Is There Any Innovation Left in Test? Bill Eklow, Cisco Systems
10:40-11:00
Exhibitor presentations Chairman: Jürgen Sedlacek
11:00-11:30
Coffee Break / Exhibition  
11:30-13:00
Session 1: Structural Test Chairman: Mick Austin
11:30-12:00
Probe design and material selection for optimal lead free board testing Bruce Valentine, IDI
12:00-12:30
Using Wave Form To Test For Opens On Component Packages Michael Smith, Consultant
12:30-13:00
Testing High-Density Electro-Optical Backplane Knut Båtstoløkken, Kitron
13:00-14:00
Lunch  
14:00-15:30
Session 2: Structural/Functional Test Chairman: Birger Schneider
14:00-14:30
Laser Height Measurement Monitoring Solder and Placement of BGA, uBGA and Flip Chips Michael Smith, Consultant
14:30-15:00
Hardware In the Loop (HIL) testing is mainly used in Aerospace and Automotive but is suitable to use for many other embedded products Hans Nyström, Prevas
15:00-15:30
Functional Test Developing Under The Economic Crises without reducing testability Stig-Gunnar Jensen, Flextronics
15:30-16:00
Coffee Break / Exhibition  
16:00-17:00
Session 3: Various Test Techniques 1 Chairman: Artur Jutman
16:00-16:30
The Benefits of FPGA-Enabled Instruments In RF and Communications Test Johan Olsson, NI
16:30-17:00
News from Conferences Chairman: Artur Jutman
17:00-17:25
Fruits & Refreshments / Exhibition  
17:25-19:00
Panel debate: “Will Test survive the economic crises and can we afford quality variations” Panel moderator: Birger Schneider
20:00
Dinner at Scandic Infra City Hotel  
22:30
Social get-together in the Bar at Scandic Infra City  

Wednesday, December 2nd, 2009
Time
Titles Speakers or additional info
9:00-9:30
Invited Speaker Chairman: Knut Båtstoløkken
9:00-9:30
From Technology Trends To Requirements – New Views About Instruments Jyrki Sippola, NOKIA
9:30-10:30
Session 4: Boundary Scan 1 Chairman: Stig-Gunnar Jensen
9:30-10:00
BS2VHDL and Other Embedded Techniques for BS Test Acceleration Artur Jutman, Tallinn University of Technology
10:00-10:30
Deployment of JTAG Based HW Self-Test in a Radio Base Station Thomas Kronqvist, SAAB
10:30-11:00
Coffee Break / Exhibition  
11:00-12:30
Session 5: Boundary Scan 2 Chairman: Bjørn B. Larsen
11:00-11:30
RAM testing with Boundary Scan - Structural Test or Functional Test? Jan Heiber, GOEPEL Electronic
11:30-12:00
Using Configurable Logic And Boundary Scan To Test Advanced Board Interface Protocols Anthony Sparks, JTAG Technologies
12:00-12:30
Non-Intrusive Board Test Strategies For The Intel Xeon Processor 5500 Series Kent Zetterberg, ASSET InterTech Inc
12:30-13:30
Lunch  
13:30-15:00
Session 6: Various Test Techniques 2 Chairman: Bengt Magnhagen
13:30-14:00
An (Almost) C-Testable Strategy For NoCs Kim Petersén, HDC
14:00-14:30
How To Optimize Your PXI Functional Test System combined JTAG Boundary Scan Technology Victor Fernandes, Geotest MTS
14:30-15:00
Acoustical Noise Problems in Production Test of Elektroacoustical Units and Electronic Cabinets Birger Schneider, NI
15:00-15:15
Closing Session: concluding remarks Knut Båtstoløkken



Dinner and Social Get-Together

At 20:00 we will enjoy a dinner sourounded by a tropical environment enclosed by palm treas and a pond.

Exhibition

As usually, a mini exhibition will take place in frames of Test Forum event where vendors are welcome to present their tools and methodologies related to production test. Exhibitors can make arrangements with NTF about exhibition space. If nothing special has been agreed, a table of about 60x120 cm2, as well as space for posters or similar material will be provided. Every exhibitor will be given a 7-8-minute slot in the program for a brief introduction.

NTF Annual General Assembly

This year's NTF AGM will take place on November 30th, at 19:30. The participation is open for all members. No registration is necessary.

If you do not intend to participate in the Annual Assembly, the TestForum 2009 starts with Registration on December 1st, at 9:00.

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