TestForum 2004
November 30 - December 1, 2004, at Vår Gård, Saltsjöbaden, Sweden
TestForum is an annual event that Nordic Test Forum (NTF) runs every fall/early winter. NTF also runs 2 to 3 thematic events
during a year, but these are focused events addressing basically only one topic area, each in the area of test and inspection of electronics,
whereas TestForum typically has 3-thematic areas and cover the broader balance of test and inspection as well.
This year the number of attendants where around 70 and came from the Nordic countries as well as from Germany, Great Britain, France, The
Netherlands and the USA.
TestForum 2004 comprises three main topics;
- Functional test including RF test
- Structural test including updates on important Boundary Scan related standards
- Test strategies and test economies
PROGRAMME
NTF04, 30 November - 1 December 2004 |
Day 1 |
Time |
Title |
Presenter |
08:30 |
NTF Annual General Assembly |
For members and all interested |
10:00 |
Registration |
|
10:30 |
Welcome/Introduction |
Knut Båtstoløkken, Kitron
Gunnar Carlsson, Ericsson |
10:40 |
Key Note Session |
Chairman: Knut Båtstoløkken |
10:40 |
Economics of Testing |
Michael Wahl, University of Siegen |
11:30 |
Test challenges and Changes |
Bernard Sutton, Independent |
12:15 |
Exhibition and Lunch |
|
13:45 |
Functional Test |
Chairman: Gunnar Carlsson |
13:45 |
Functional Test Objectives and Methods
|
Hans Högberg, Ericsson |
14:15 |
Mixed Signal Instruments for Coherent Test Applications
|
Johan Olsson, National Instruments |
14:45 |
Challenges in Integrating RF Test Applications |
Birger Schneider, microLEX Syst. |
15:15 |
Coffee Break
|
|
15:45 |
RF Test |
Chairman: Birger Schneider |
15:45 |
A Modular Instrument Approach
|
Patrik Stenvard, Ericsson |
16:15 |
Bluetooth Radio Test and Qualification |
Ragnar Lindholm, Rhode & Schwarz |
16:45 |
Bluetooth test solution |
Magnus Björk Elcoteq Tallinn |
17:15 |
Fruit & Refreshments |
|
17:45 |
News from Conferences |
Michael J. Smith, Pete Collins |
18:15 |
Should Functional Test Patch the Holes in the Process Control and Test? |
Panel moderator: Birger Schneider |
20:00 |
Dinner |
|
21:30 |
Social get-together |
|
Day 2 |
Time |
Title |
Presenter |
08:30 |
Structural Test |
Chairman: Bengt Magnhagen |
09:00 |
AOI/AXI
|
Michael J. Smith Teradyne |
08:30 |
Using Flying prober and Boundary Scan |
Saeed Taheri, Acculogic |
09:30 |
The Impact of Low Voltage Technologies on In-Circuit Test
|
Michael J. Smith Teradyne |
10:00 |
Coffee Break |
|
10:30 |
Standards Update |
Chairman: Mick Austin |
10:30 |
Mixed signal Boundary Scan, reality or myth? |
Pete Collins, JTAG Technologies |
11:00 |
Advanced Digital Signal Boundary-scan (1149.6)
|
Ken Filliter, National Semiconductor |
11:30 |
P1500, a Standard for System on Chip DFT
|
Kim Petersén, HDC |
12:00 |
Lunch |
|
13:30 |
Test Strategies Test Economics and Advanced Test Techniques |
Chairman: Knut Båtstoløkken |
13:30 |
Using Boundary Scan Emulation for Functional Verification
|
Johan Rehnberg, ISS Group |
14:00 |
Calculation of Board Test Coverage
|
Christophe Lotz, ASTER Ingenierie |
14:30 |
Coffee Break |
|
15:00 |
Strategist - A Test Strategy Tool
|
Michael J. Smith TeradyneDavid |
15:30 |
System Control of Remote Boundary Scan over I2C/IPMB
|
Gunnar Carlsson, Ericsson |
16:00 |
Test Forum Close |
hKnut Båtstoløkken |
|
The first key note speaker was Michael Wahl from the University of Siegen, who spoke about Economics of Testing. Michael gave us
interesting thoughts, based on his wide experience within the fields of Design for Testability and its economy.
Michael Wahl, University of Siegen, Key Note Speaker No 1
Bernard Sutton, now an independant consultant (earlier Teradyne) spoke about the impact of lead-free soldering on test. This is an
area of retest interest because the EU-directives tells us to get rid of "all lead" in our electronic products at July 2006, at the
latest! Later on in the conference programme, Bernard presented new ideas in the area of structural testing.
Michael J. Smith, Teradyne, was very active and entusiastic during the conference. His presentations included AOI/AXI comments on news and
strategies in the area of Inspection. Another interesting presentation from Michael was about the Test strategy tool from Teradyne,
"Strategist". The software package will decrease the time to market and handle the questions about Time to volume.
From left: Michael J. Smith, Teradyne and Bernard Sutton, Independent consultant
Part of the audience
More of the audience
Bernard Sutton, Key Note Speaker No 2, in action.
Suzanne Holte, the effective Danish secretary from microLEX AS
Bengt Nilsson and Bengt Kralmark, Partnertech, Sweden
Birger Schneider, microLEX and Ragnar Lindholm, Rohde & Schwartz
Gunnar Carlsson, Ericsson, the conference organiser, made the Welcome and
the conference Introduction presentations
Hans Högberg, Ericsson, "Functional test Objectives and Methods"
Hans-Erik Uleander, Saab Test Systems, advocate for a sale
Karl Svedberg and Bo Griphult, Teleinstrument Kontest, part of the exhibition
From left: Knut Båtstolökken, Kitron Development, Terje Sætre, Norautron and Mehrmad Ghaffarpour,
Simrad Egersund
From left: Ole Flesaker, Buskeryd University(NO), Mick Austin, JTAG (FI) and
Birger Schneider, microLEX (DK)
Panel: Michael, Bernard, Mick and Magnus Björk, Elcoteq Network
All presentations was avaiable for the attendants in paper form.
Next events arranged by Nordic Test Forum will be advertised at www.nordictestforum.org
Updated 2005 February 01
|