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NTF - Message Board

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 1 
 on: 09.08.2017, 08:26:33 
Started by knub - Last post by knub
Preliminary program for TestForum 2017 in Vantaa, Finland November 28th-29th is available here:
http://nordictestforum.org/2017


 2 
 on: 27.07.2017, 21:54:21 
Started by ian.m.mcintosh - Last post by ian.m.mcintosh
This is a call for participation in the "System Test Access Management" Study Group (also referred to as 'SJTAG'). Those interested in joining the study group or being kept informed of its activities should notify their interest by email to chair@sjtag.org or via the group's Contact Page (http://www.sjtag.org/members/contact-us).

The goal of this study group is to explore the feasibility and to develop a project authorization request (PAR), including the scope and purpose, for an IEEE standard that defines methods to allow, in conjunction with existing methods, for the coordination and control of device, board, and sub-system test interfaces to extend access to the system level, by leveraging existing test interface standards (by defining a description to better manage how they are used in the system).

Among the use cases to be considered by such a standard are structural and functional test, configuration / tuning / instrumentation, software debug, built-in self test, fault injection, programming / updates, root cause analysis, failure mode analysis, power-on self test, environmental stress test, and device versioning.

This new supervisory standard is required to define the coordination and dependencies of instruments as well as configuration, management, and application of vector based testing at the board and system levels, utilizing the pin level access provided by other standards. IEEE 1687 (a.k.a. iJTAG) and IEEE 1149.1-2013 (often referred to as JTAG) provide methods for describing instrument interfaces on a per component basis, but do not provide the contextual prerequisites for the dependence on each instrument configuration and/or aggregation of multiple instruments for the overall board and/or system maintenance operations. Further, many components only support non-JTAG interfaces (e.g., I2C or SPI) to their instrumentation registers.

The study group activity will last for 6 to 12 months, with the intended outcome of the creation of a Working Group to continue the IEEE standardization effort. The group will meet on-line on a weekly basis for one hour long conference calls tentatively scheduled for Mondays at 11am EDT (15:00 UTC), commencing August 14.

Information about past activity of the SJTAG initiative group that resulted in formation of this study group can be found at http://www.sjtag.org.

Regards,
Ian McIntosh

(A copy of this invite is available on the SJTAG website: If you wish to forward this invite to any colleagues please give them this link: http://www.sjtag.org/news/465-participation-invite-system-test-access-management-study-group)

 3 
 on: 17.02.2017, 11:24:18 
Started by Artur Jutman - Last post by Artur Jutman
Contributions covering IEEE 1149.x, IEEE 1500, IEEE 1687, IEEE P1838, IEEE 1450, and others are expected. The workshop is co-located with ETS’2017 at Amathus Beach Hotel, Limassol, Cyprus on May 25–26. http://www.iti.uni-stuttgart.de/testa2017

 4 
 on: 07.03.2016, 16:08:26 
Started by erila - Last post by erila
Dear all,

the Test Standards Application Workshop (TESTA) will be held in Amsterdam on May 26:th and May 27,
in conjunction with European Test Symposium. The workshop focuses on best practices around recently released test standards IEEE 1149.1-2013 and IEEE 1687- 2014, as well as IEEE 1500-2005. The call for participation is found here:
http://www.ets16.nl/workshops/testa/
where you also find key dates.

Best regards
Erik

 5 
 on: 18.02.2015, 14:52:34 
Started by Tor Magnus Strøm Briskodden - Last post by Tor Magnus Strøm Briskodden
I'm interested if anyone have anything to share on this topic. (Concerns, lessons learned etc)

 6 
 on: 26.11.2014, 17:53:20 
Started by Artur Jutman - Last post by Artur Jutman
NTF is pleased to announce that in 2014 it hosts the fringe workshop of European Commission funded FP7 project BASTION. The project description and workshop agenda are available at the BASTION Project website: http://www.fp7-bastion.eu/.

 7 
 on: 30.10.2013, 23:35:27 
Started by Artur Jutman - Last post by Artur Jutman
This year's NTF's TestForum conference takes place in the picturesque city of Tallinn, Estonia, where late November dresses the streets in a colorful Christmas costume. Make sure you stay an extra night after the conference if it is your first visit here. Walk the narrow cobblestone streets all the way to the Upper Town to see the deep black hole of the Baltic sea and feel the warmth of the bright city streets beneath your feet. Then walk down to the Town Hall square and sip a glass of hot wine at the Christmas market.

 8 
 on: 09.04.2013, 12:12:23 
Started by lhkj - Last post by lhkj
A full conference and exhibition day with focus on latest PXI instrumentation & technology.
www.thepxishow.se - visit here for more information of the location, agenda and free sign-up.

 9 
 on: 29.11.2012, 22:03:45 
Started by knub - Last post by knub
Article from TestForum 2012 (in Norwegian)

http://elektronikknett.no/Artikkelarkiv/2012/November/Slutt-paa-test-av-elektronikk


 10 
 on: 01.03.2011, 07:59:08 
Started by Jukka.Antila - Last post by Jukka.Antila
Hi all NTF members and visitors,

You might be interested to visit recently opened Testele.com -site.  Pages are presenting articles and tools concentrating in test strategies, test economics and quality.  And more to come.

BR,
Jukka Antila
Chief Editor

http://testele.com


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