Technical Program of Test Forum 2017



Download conference program as a PDF booklet here!
Updated 2017.11.02.


Tuesday, November 28th, 2017
Time
Titles
Speakers or additional info
08:30-08:50
Registration
 
08:50-09:00
Welcome / Introduction
Knut Båtstoløkken
09:00-10:00
Key Note Session
Chairman: Knut Båtstoløkken
09:00-10:00
20 Billion Connected Devices, How to Test them All – or Not to Test at All?
Jaakko Ala-Paavola, Etteplan
10:00-10:30
Exhibitor Forum: short presentations
Chairman: Stig-Gunnar Jensen
10:30-11:00
Coffee Break / Exhibition
 
11:00-12:30
Session 1: Test Strategies 1
Chairman: Mick Austin
11:00-11:30
Could be the Flying Probe an alternative to the Board Tester System?
Lothar Diez, SPEA
11:30-12:00
In-Circuit test vs functional test
Hans Baka, DigitalTest
12:00-12:30
The Odds of Test and Measurement
Hans Manhaeve, Ridgetop Europe
12:30-13:30
Lunch
 
13:30-15:00
Session 2: Test system design
Chairman: Magnus Rönnqvist
13:30-14:00
A short introduction to Lean concepts
Mikko Karjalainen, KaVo Kerr Group
14:00-14:30
Lean tools in production test development
Tomi Pietari, Vaisala
14:30-15:00
To Platform or Not to Platform - aspects of designing test systems
Mattias Ericsson, AddQ
15:00-15:30
Coffee Break / Exhibition
 
15:30-16:30
Session 3: Test Strategies 2
Chairman: Mauri Aalto
15:30-16:00
Point Solutions or Plant-based MES and Beyond?
Ignace Braem, Siemens Industry Software
16:00-16:30
Are traditional SPC tools the right choice for finding quality issues in electronics manufacturing?
Tom Andres Lomsdalen, Virinco
16:30-17:00
News from conferences
Chairman: Artur Jutman
17:00-17:30
Fruit & Refreshments / Exhibition
 
17:30-19:00
Panel debate “Internet of Things (IoT)serving the test Community – and how do we test IoT?”
Panel moderator: Birger Schneider
19:30
Dinner
 

Wednesday, November 29th, 2017
Time
Titles
Speakers or additional info
09:00-10:30
Session 4: Fixturing & test interfaces
Chairman: Raimedas Sodaitis
09:00-09:30
Eliminating Cables from PXI ATE systems
Gary Clayton, MAC-Panel
09:30-10:00
Latest Mass Interconnect Solutions - i.e. High Speed, High Power, EMI solutions...
Werner S. Pinter, Virginia Panel Corporation
10:00-10:30
Best practices in functional testing, Case study with SKS Automation Oy
Teppo Välisaari, Etteplan
10:00-11:00
Coffee Break / Exhibition
 
11:00-12:30
Session 5: Functional Test
Chairman: Lars Kongsted-Jensen
11:00-11:30
Box-builds in production testing and outlook for future
Jani Angervuo, Kone
11:30-12:00
Unified EoL test and programming over automotive bus
Jan Heiber, Göpel
12:00-12:30
Improving Testability During PCB Design
Mark Laing, Siemens (Valor)
12:30-13:30
Lunch
 
13:30-15:00
Session 6: JTAG Based Test
Chairman: Artur Jutman
13:30-14:00
Eliminating or minimising Embedded Software Tests.
Mick Austin, JTAG Technologies / Jussi Mustola, Etteplan
14:00-14:30
SiliconInsight / IJTAG
Martin Keim, Mentor
14:30-15:00
Boundary Scan Design Review for Better Test Strategy
Thomas Götz, Keysight
15:00-15:10
Closing Session: TestForum concluding remarks
Knut Båtstoløkken Kitron
15:10-15:30
Coffee Break / Exhibition
 
15:30-17:00
Session : Extra Session
Chairman: Mick Austin
15:30-16:00
TR5001S2 Parallel Test
Tamás Szabó, Equip-Test
16:00-16:30
Electronic drivers for LEDS - why are many failing
Birger Schneider, Delta
16:30-17:00
Would Functional Tests Detect All Timing Issues On a Board?
R. Cantoro, E. Sanchez, M. Sonza Reorda, Politecnico di Torino, A. Jutman, Testonica Lab

Exhibition

As usually, a mini exhibition will take place in frames of TestForum event where vendors are welcome to present their tools and methodologies related to production test. Exhibitors can make arrangements with NTF about exhibition space. If nothing special has been agreed, a table of about 60x120 cm2, as well as space for posters or similar material will be provided. Every exhibitor will be given 7-8-minute slot in the program for a brief introduction.

Dinner

The conference dinner on November 28th will be held at the conference hotel. After the dinner, all participants are invited back to the bar.

Nordic Test Forum (NTF) Annual Assembly, November 27th 2017

The NTF organization was established in 2001. Since then, it holds an annual general assembly a day before the Test Forum conference. This year it will be held on November 27th at 20:00. The agenda and motions has been dispatched to the members in a separate mailing.

If you do not intend to participate in the Annual Assembly, the Test Forum 2017 starts with registration on November 28th from 8:30 to 8:50.

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