Download Presentations of Test Forum 2017
Download conference program as a PDF booklet here!
Updated 2017.11.19.
Updated 2017.11.19.
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Tuesday, November 28th, 2017
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Time
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Titles
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Speakers or additional info
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08:30-08:50
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Registration
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08:50-09:00
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Welcome / Introduction
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Knut Båtstoløkken
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09:00-10:00
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Key Note Session
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Chairman: Knut Båtstoløkken
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09:00-10:00
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20 Billion Connected Devices, How to Test them All – or Not to Test at All?
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Jaakko Ala-Paavola, Etteplan
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10:00-10:30
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Chairman: Stig-Gunnar Jensen
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10:30-11:00
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Coffee Break / Exhibition
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11:00-12:30
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Session 1: Test Strategies 1
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Chairman: Erik Larsson
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11:00-11:30
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Lothar Diez, SPEA
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11:30-12:00
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Hans Baka, DigitalTest
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12:00-12:30
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Hans Manhaeve, Ridgetop Europe
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12:30-13:30
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Lunch
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13:30-15:00
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Session 2: Test system design
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Chairman: Bjørn B. Larsen
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13:30-14:00
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Mikko Karjalainen, KaVo Kerr Group
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14:00-14:30
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Tomi Pietari, Vaisala
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14:30-15:00
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Mattias Ericsson, AddQ
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15:00-15:30
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Coffee Break / Exhibition
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15:30-16:30
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Session 3: Test Strategies 2
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Chairman: Mauri Aalto
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15:30-16:00
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Mark Laing, Siemens (Valor)
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16:00-16:30
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Tom Andres Lomsdalen, Virinco
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16:30-17:00
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News from conferences
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Chairman: Artur Jutman
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17:00-17:30
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Fruit & Refreshments / Exhibition
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17:30-19:00
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Panel debate “Internet of Things (IoT)serving the test Community – and how do we test IoT?”
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Panel moderator: Birger Schneider
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19:30
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Dinner
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Wednesday, November 29th, 2017
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Time
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Titles
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Speakers or additional info
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09:00-10:30
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Session 4: Fixturing & test interfaces
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Chairman: Raimedas Sodaitis
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09:00-09:30
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Gary Clayton, MAC-Panel
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09:30-10:00
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Werner S. Pinter, Virginia Panel Corporation
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10:00-10:30
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Vesa Koski, Etteplan
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10:30-11:00
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Coffee Break / Exhibition
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11:00-12:30
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Session 5: Functional Test
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Chairman: Lars Kongsted-Jensen
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11:00-11:30
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Jani Angervuo, Kone
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11:30-12:00
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Jan Heiber, Göpel
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12:00-12:30
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Mark Laing, Siemens (Valor)
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12:30-13:30
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Lunch
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13:30-15:00
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Session 6: JTAG Based Test
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Chairman: Artur Jutman
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13:30-14:00
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Mick Austin, JTAG Technologies / Jussi Mustola, Etteplan
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14:00-14:30
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Martin Keim, Mentor
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14:30-15:00
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Jun Balangue, Keysight
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15:00-15:10
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Closing Session: TestForum concluding remarks
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Knut Båtstoløkken Kitron
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15:10-15:30
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Coffee Break / Exhibition
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15:30-17:00
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Session 7: Functional test revisited
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Chairman: Mick Austin
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15:30-16:00
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Birger Schneider, Delta
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16:00-16:30
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R. Cantoro, E. Sanchez, M. Sonza Reorda, Politecnico di Torino, A. Jutman, Testonica Lab
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16:30-17:00
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Tamás Szabó, Equip-Test
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