Technical Program of Test Forum 2013
Tuesday, November 26th, 2013
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Time
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Titles | Speakers or additional info |
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8:30-9:00
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Registration | |
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9:00-9:15
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Welcome/Introduction | Knut Båtstoløkken |
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9:15-10:15
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Key Note Session | Chairman: Knut Båtstoløkken |
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9:15-10:15
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Differences between IEEE 1149.1-2013 and IEEE P1687 | Al Crouch, ASSET InterTech |
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10:15-10:45
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Exhibitor Forum: short presentations | Chairman: Mick Austin |
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10:45-11:15
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Coffee Break / Exhibition | |
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11:15-12:45
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Session1: Test Strategies and Test Quality | Chairman: Birger Schneider |
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11:15-12:15
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Controlling test and manufacuring process using WATS | Mads Dahl, Eltek Tom Andres Lomsdalen, Virinco |
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12:15-12:45
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NI FlexRIO instruments for building innovative measurement systems for RF applications | Orbel Sevoyan, National Instruments |
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12:45-13:45
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Lunch | |
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14:00-15:30
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Session 2: JTAG Based Test | Chairman: Artur Jutman |
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14:00-14:30
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Measuring passive components using IEEE1149.1 | Marko Turpeenoja, BASS Solutions |
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14:30-15:00
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Bit Error Rate Test (BERT) by FPGA Embedded Instruments | Thomas Wenzel, Göpel electronic |
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15:00-15:30
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Interactive debug of CPU and peripheral hardware via 1149.1 Port | Marc van Houcke, JTAG Technologies |
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15:30-16:00
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Coffee Break / Exhibition | |
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16:00-17:00
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Session 3: Functional Test | Chairman: Lars Kongsted-Jensen |
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16:00-16:30
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Test system HW design that lasts for ever | Linda Hellum, Kitron |
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16:30-17:00
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Life cycle of testing | Jaakko Ala-Paavola, Espotel |
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17:00-17:30
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Fruits & Refreshments / Exhibition | |
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17:30-19:00
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Panel debate: "What does Board Test look like in 5-10 years? Will Structural test be relevant?" |
Panel moderator: Birger Schneider |
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19:30
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Departure to the restaurant in the Old Town | |
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20:00
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Dinner in the restaurant Troika at the Town Hall square | |
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23:00
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Social get-together in the Bar back at Swissôtel (one free drink is offered) | |
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Wednesday, November 27th, 2013 |
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Time
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Titles | Speakers or additional info |
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9:00-10:30
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Session 4: Test Strategies and Test Quality | Chairman: Mauri Aalto |
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9:00-09:30
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DfX & Test Coverage | Christophe Lotz, ASTER Technologies |
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09:30-10:00
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COMPASS: The repair software and quality assurance software for all test systems | Lothar Diez, SPEA |
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10:00-10:30
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VPC Mass Interconnect - Scalable Solutions | Werner Pinter, Virginia Panel |
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10:30-11:00
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Coffee Break / Exhibition | |
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11:00-13:00
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Session 5: Invited speaker and tutorial | Chairman: Magnus Rönnqvist |
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11:00-12:00
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From 2D Boards to 3D Chips: Test and DfT Challenges and Solutions | Erik Jan Marinissen, IMEC |
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12:00-13:00
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Synthetic Test | Lars Johansson, Syntronic |
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13:00-14:00
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Lunch | |
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14:00-15:30
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Session 6: Embedded instrumentation | Chairman: Erik Larsson |
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14:00-14:30
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Accessing embedded instruments through the life-cycle of a chip using P1687 | Farrokh Ghani Zadegan, University of Linköping |
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14:30-15:00
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Securing your system with P1687 | Jennifer Lynn Dworak, Southern Methodist University |
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15:00-15:30
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Board and SoC Test Instrumentation for Ageing and No Failure Found | Artur Jutman, Testonica Lab |
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15:30-15:45
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Closing Session: concluding remarks | Knut Båtstoløkken |