Program

Program changes will be published here.

NTF04 -- 30 November - 1 December 2004
Day 1 - Tuesday 30 November
Time Title Presenter
08:30 NTF Annual General Assembly  
10:00 Registration  
10:30 Welcome/Introduction Knut Båtstoløkken

Gunnar Carlsson
10:40 Key Note Session Chairman: Knut Båtstoløkken
10:40
Economics of Testing
 Michael Wahl, University of Siegen
11:30
Test Challenges and Changes
 Bernard Sutton, Independent
12:15 Exhibition  
12:45 Lunch  
13:45 Functional Test Chairman: Gunnar Carlsson
13:45
Functional Test Objectives and Methods
 Hans Högberg, Ericsson
14:15
Mixed Signal Instruments for Coherent Test Applications
 Johan Olsson, National Instruments
14:45
Challenges in Integrating RF tests in Functional Test Systems
 Birger Schneider, microLEX Systems AS
15:15 Coffee Break  
15:45 RF Test Chairman: Birger Schneider
15:45
A Modular Instrument Approach
 Patrik Stenvard, Ericsson
16:15
Bluetooth Radio Test and Qualification
 Ragnar Lindholm, Rohde & Schwartz
16:45
Bluetooth Test Solution
 Magnus Björk, Elcoteq Tallinn
17:15 Fruit & Refreshments  
17:45 News from Conferences Michael J. Smith, Pete Collins
18:15 Should Functional Test Patch the Holes in the Process Control and Test? Panel moderator: Birger Schneider
20:00 Dinner  
21:30 Social get-together  
Day 2 - Wednesday 1 December
Time Title Presenter
08:30 Structural Test Chairman: Bengt Magnhagen
08:30
AOI/AXI
 Michael J. Smith, Teradyne
09:00
Using Flying Prober and Boundary Scan
 Saeed Taheri, Acculogic
09:30
The Impact of Low Voltage Technologies on In-Circuit Test
 Michael J. Smith, Teradyne
10:00 Coffe Break  
10:30 Standards Update Chairman: Mick Austin
10:30
Mixed signal boundary scan, reality or myth?
 Pete Collins, JTAG Technologies
11:00
Advanced Digital Signal Boundary-scan (1149.6)
 Ken Filliter, National Semiconductor
11:30
P1500, a Standard for System on Chip DFT
 Kim Petersén, HDC
12:00 Exhibition  
12:30 Lunch  
13:30 Test Strategies, Test Economics and Advanced Test Techniques Chairman: Knut Båtstoløkken
13:30
Using Boundary Scan Emulation for Functional Verification
 Johan Renberg, ISS Group
14:00
Calculation of Board Test Coverage.
 Christophe Lotz, ASTER Ingenierie
14:30 Coffe Break  
15:00
Strategist - A Test Strategy Tool
 Michael J. Smith, Teradyne
15:30
System Control of Remote Boundary Scan over I2C/IPMB
 Gunnar Carlsson, Ericsson
16:00 Test Forum Close Knut Båtstoløkken